Technical Program

Paper Detail

Paper:WE2.W1.2
Session:Techniques for Classification of SAR Data
Time:Wednesday, July 29, 10:50 - 11:10
Presentation: Oral
Topic: Data Analysis Methods (Optical, Multispectral,Hyperspectral, SAR): Classification and Clustering
Title: A HIERARCHICAL PATCH CLUSTERING METHOD FOR HIGH-RESOLUTION TERRASAR-X IMAGES
Authors: Wei Yao; University of Siegen 
 Otmar Loffeld; University of Siegen 
 Mihai Datcu; German Aerospace Center (DLR)