TH1.T02: SAR Image Analysis III

Session Type: Oral
Time: Thursday, July 25, 08:20 - 10:00
Location: Room 105
Session Chair: Maurizio Migliaccio, University of Naples Parthenope
 
[View Video] TH1.T02.1: AN ADAPTIVE TOTAL VARIATION REGULARIZATION METHOD FOR SAR IMAGE DESPECKLING
         Yao Zhao; Institute of Electronics, Chinese Academy of Sciences
         Jianguo Liu; Imperial College
         Bingchen Zhang; Institute of Electronics, Chinese Academy of Sciences
         Wen Hong; Institute of Electronics, Chinese Academy of Sciences
         Yirong Wu; Institute of Electronics, Chinese Academy of Sciences
 
[View Video] TH1.T02.2: RADON TRANSFORM BASED EDGE DETECTION FOR SAR IMAGERY
         Surender Varma Gadhiraju; Indian Institute of Technology Bombay
         Biplab Banerjee; Indian Institute of Technology Bombay
         Arnab Muhuri; Indian Institute of Technology Bombay
         Avik Bhattacharya; Indian Institute of Technology Bombay
         Krishna Mohan Buddhiraju; Indian Institute of Technology Bombay
 
[View Video] TH1.T02.3: ANALYSIS OF POLARIMETRIC VESSEL SIGNATURES IN SAR IMAGE BASED ON POLARIMETRIC DECOMPOSITION
         Fan Wu; Center for Earth Observation and Digital Earth, Chinese Academy of Sciences
         Chao Wang; Center for Earth Observation and Digital Earth, Chinese Academy of Sciences
         Hong Zhang; Center for Earth Observation and Digital Earth, Chinese Academy of Sciences
         Bo Zhang; Center for Earth Observation and Digital Earth, Chinese Academy of Sciences
         Yixian Tang; Center for Earth Observation and Digital Earth, Chinese Academy of Sciences
 
[View Video] TH1.T02.4: A NOVEL QUALITY EVALUATION ALGORITHM FOR SAR IMAGE BASED ON HUMAN VISUAL SYSTEM
         Yu-Jing Liu; Beihang University
         Ze Yu; Beihang University
         Chun-Sheng Li; Beihang University
 
[View Video] TH1.T02.5: ANGULAR SUPERRESOLUTION FOR REAL BEAM RADAR WITH ITERATIVE ADAPTIVE APPROACH
         Yongchao Zhang; School of Electronic Engineering, University of Electronic Science and Technology of China
         Yin Zhang; School of Electronic Engineering, University of Electronic Science and Technology of China
         Wenchao Li; School of Electronic Engineering, University of Electronic Science and Technology of China
         Yulin Huang; School of Electronic Engineering, University of Electronic Science and Technology of China
         Jianyu Yang; School of Electronic Engineering, University of Electronic Science and Technology of China