Paper ID | CIS-1.8 | ||
Paper Title | CAD-BASED SCATTER COMPENSATION FOR POLYCHROMATIC RECONSTRUCTION OF ADDITIVE MANUFACTURED PARTS | ||
Authors | Domenico Iuso, Ehsan Nazemi, Nathanaël Six, Björn De Samber, Jan De Beenhouwer, Jan Sijbers, University of Antwerpen, Belgium | ||
Session | CIS-1: Computational Imaging Systems | ||
Location | Area J | ||
Session Time: | Monday, 20 September, 15:30 - 17:00 | ||
Presentation Time: | Monday, 20 September, 15:30 - 17:00 | ||
Presentation | Poster | ||
Topic | Computational Imaging Systems: Tomographic Imaging | ||
IEEE Xplore Open Preview | Click here to view in IEEE Xplore | ||
Abstract | High density materials, such as metals, strongly scatter X-ray photons during X-ray Computed Tomography (CT) scans, which is detrimental to the quality of the reconstructed images. In this study, a scatter compensation method for X-ray CT, based on Monte-Carlo (MC) simulations from the object's CAD model, is presented and employed in conjunction with polychromatic reconstructions. The estimation of the scatter contributions is accelerated by 1) reducing the number of simulated projections accordingly to the Nyquist theorem, 2) noise reduction 3) angular interpolation. The method was applied to enhance CT images of a steel object produced via Additive Manufacturing, whose CAD model is known. Results show that, in conjunction with polychromatic reconstruction, our method can efficiently reduce beam hardening, scattering artifacts and increase the contrast of defects within the object. |