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TA.L8: Integrative Applications: Industrial |
| Session Type: Lecture |
| Time: Tuesday, September 27, 10:30 - 12:30 |
| Location: Room 105 C |
| Session Chair: Moncef Gabbouj, Tampere University of Technology |
| Presented 10:30 - 10:50 |
| TA.L8.1: HIGH QUALITY TRADEMARK PROPOSALS BASED ON TRADEMARK-CONFIDENCE SCORE OF MSERS |
| Yuan Zhang; Samsung Electronics |
| Wei Wen; Samsung Electronics |
| Lei Nie; Samsung Electronics |
| Junjun Xiong; Samsung Electronics |
| Yehui Yang; Chinese Academy of Sciences |
| Presented 10:50 - 11:10 |
| TA.L8.2: A MORPHOLOGICAL APPROACH TO THE AUTOMATIC DETECTION OF DARK FRINGES APPLIED TO BIREFRINGENCE IMAGES |
| Lucas Thomaz; Universidade Federal do Rio de Janeiro |
| Allan da Silva; Universidade Federal do Rio de Janeiro |
| Eduardo da Silva; Universidade Federal do Rio de Janeiro |
| Sergio Netto; Universidade Federal do Rio de Janeiro |
| Andre Castro; Universidade Federal do Rio de Janeiro |
| Juliana Pereira; Universidade Federal do Rio de Janeiro |
| Argimiro Secchi; Universidade Federal do Rio de Janeiro |
| Presented 11:10 - 11:30 |
| TA.L8.3: ROBUST REAL-TIME UAV BASED POWER LINE DETECTION AND TRACKING |
| Guang Zhou; University of Texas at Dallas |
| Jinwei Yuan; University of Texas at Dallas |
| I-Ling Yen; University of Texas at Dallas |
| Farokh Bastani; University of Texas at Dallas |
| Presented 11:30 - 11:50 |
| TA.L8.4: IS OVERFEAT USEFUL FOR IMAGE-BASED SURFACE DEFECT CLASSIFICATION TASKS? |
| Pei-Hung Chen; Nanyang Technological University |
| Shen-Shyang Ho; Nanyang Technological University |
| Presented 11:50 - 12:10 |
| TA.L8.5: MULTI-FEATURE SPARSE-BASED DEFECT DETECTION AND CLASSIFICATION IN SEMICONDUCTOR UNITS |
| Bashar Haddad; Arizona State University |
| Lina J. Karam; Arizona State University |
| Jieping Ye; Arizona State University |
| Nital Patel; Intel Corporation |
| Martin Braun; Intel Corporation |
| Presented 12:10 - 12:30 |
| TA.L8.6: ANOMALY REGION DETECTION AND LOCALIZATION IN METAL SURFACE INSPECTION |
| Sriram Vaikundam; Rolls Royce @ NTU corporate lab |
| Tzu-Yi Hung; Rolls Royce @ NTU corporate lab |
| Liang Tien Chia; Nanyang Technological University |