Paper Detail
| Paper: | TA-L8.5 | ||
| Session: | Integrative Applications: Industrial | ||
| Time: | 11:50 - 12:10 | ||
| Presentation: | Lecture | ||
| Topic: | Integrative Applications: Integrative Applications | ||
| Title: | MULTI-FEATURE SPARSE-BASED DEFECT DETECTION AND CLASSIFICATION IN SEMICONDUCTOR UNITS | ||
| Authors: | Bashar Haddad; Arizona State University | ||
| Lina J. Karam; Arizona State University | |||
| Jieping Ye; Arizona State University | |||
| Nital Patel; Intel Corporation | |||
| Martin Braun; Intel Corporation | |||