Technical Program

Paper Detail

Paper:ASP-L26.4
Session:Mixed Signal Circuits
Time:Tuesday, May 25, 16:54 - 17:12
Presentation: Lecture
Topic: Analog Signal Processing: Mixed Signal Circuits and Testing
Title: FAULT MODELING OF RF BLOCKS BASED ON NOISE ANALYSIS
Authors: Jerzy Dabrowski; Link√∂ping University 
Abstract: The paper addresses spot defects in CMOS RF blocks. In a softer resistive form they degrade the circuit performance such as noise figure (NF) and gain. The NF is considered here the test response. Based on a noisy two-port model an impact of the generic faults is analyzed. A practical example of a CMOS mixer supports this analysis. Discussed is also effect of masking by the circuit tolerances. The detectability threshold for the generic faults is captured assuming Gaussian distribution for the two-port parameters. The analysis reveals both strength and weakness of the presented test approach.
 
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