ASP-L13: Mixed Signal Testing

Session Type: Lecture
Time: Monday, May 24, 16:00 - 17:30
Location: Grand Ballroom C
Co-Chairs: P. R. Mukund, Rochester Institute of Technology and Bill Eisenstadt, University of Florida
 
ASP-L13.1: LUMPED PASSIVE CIRCUITS FOR 5GHZ EMBEDDED TEST OF RF SOCS
         Jangsup Yoon; University of Florida
         William Eisenstadt; University of Florida
 
ASP-L13.2: A TRANSLINEAR-BASED RF RMS DETECTOR FOR EMBEDDED TEST
         Qizhang Yin; University of Florida
         William Eisenstadt; University of Florida
         Robert M. Fox; University of Florida
 
ASP-L13.3: THE SRE/SRM APPROACH FOR SPECTRAL TESTING OF AMS CIRCUITS
         Zhongjun Yu; Iowa State University
         Degang Chen; Iowa State University
         Randall Geiger; Iowa State University
 
ASP-L13.4: A CALIBRATION TECHNIQUE FOR A HIGH-RESOLUTION FLASH TIME-TO-DIGITAL CONVERTER
         Peter Levine; McGill University
         Gordon Roberts; McGill University
 
ASP-L13.5: AN ALTERNATIVE DFT METHODOLOGY TO TEST HIGH-RESOLUTION SIGMA DELTA MODULATORS
         Sara Escalera; IMSE - CNM - CSIC
         José M. García-González; IMSE - CNM - CSIC
         Oscar Guerra; IMSE - CNM - CSIC
         José M. de la Rosa; IMSE - CNM - CSIC
         Fernando Medeiro; IMSE - CNM - CSIC
         Belén Pérez-Verdú; IMSE - CNM - CSIC
         Angel Rodríguez-Vázquez; IMSE - CNM - CSIC
 

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