ICIP 2017 | 2017 IEEE International Conference on Image Processing | 17-20 September 2017 | Beijing, China
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Paper Detail

Paper:TQ-PC.2
Session:Biometric Recognition II
Session Time:Tuesday, September 19, 16:30 - 18:00
Presentation Time:Tuesday, September 19, 16:30 - 18:00
Presentation: Poster
Topic: IFS: Information Forensics & Security: IFS-BIM Image & Video Biometric Analysis
Paper Title: CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?
Authors: Xinwei Liu; University of Caen and Norwegian University of Science and Technology 
 Marius Pedersen; Norwegian University of Science and Technology 
 Christophe Charrier; University of Caen 
 Patrick Bours; Norwegian University of Science and Technology