Paper: | TQ-PC.2 |
Session: | Biometric Recognition II |
Session Time: | Tuesday, September 19, 16:30 - 18:00 |
Presentation Time: | Tuesday, September 19, 16:30 - 18:00 |
Presentation: |
Poster
|
Topic: |
IFS: Information Forensics & Security: IFS-BIM Image & Video Biometric Analysis |
Paper Title: |
CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY? |
Authors: |
Xinwei Liu; University of Caen and Norwegian University of Science and Technology | | |
| Marius Pedersen; Norwegian University of Science and Technology | | |
| Christophe Charrier; University of Caen | | |
| Patrick Bours; Norwegian University of Science and Technology | | |