ICIP 2017 | 2017 IEEE International Conference on Image Processing | 17-20 September 2017 | Beijing, China
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Paper Detail

Paper:WP-PE.1
Session:Texture Analysis
Session Time:Wednesday, September 20, 14:30 - 16:00
Presentation Time:Wednesday, September 20, 14:30 - 16:00
Presentation: Poster
Topic: IVA: Image & Video Analysis: IVA-TEX Texture Analysis
Paper Title: MULTI-VIEW DEEP METRIC LEARNING FOR IMAGE CLASSIFICATION
Authors: Dewei Li; University of Chinese Academy of Sciences 
 Jingjing Tang; University of Chinese Academy of Sciences 
 Yingjie Tian; Chinese Academy of Sciences 
 Xuchan Ju; Tsinghua University