Technical Program

Paper Detail

Paper:WQ-PC.8
Session:Security and Forensics Applications
Location:Poster Area C
Session Time:Wednesday, September 20, 16:30 - 18:00
Presentation Time:Wednesday, September 20, 16:30 - 18:00
Presentation: Poster
Topic: IFS: Information Forensics & Security: IFS-APP Image & Video-based Security and Forensics Applications
Paper Title: A CONSISTENT TWO-LEVEL METRIC FOR EVALUATION OF AUTOMATED ABANDONED OBJECT DETECTION METHODS
Authors: Patrick Krusch, Erik Bochinski, Volker Eiselein, Thomas Sikora, Technische Universität Berlin, Germany