| Paper: | TQ-PC.2 |
| Session: | Biometric Recognition II |
| Location: | Poster Area C |
| Session Time: | Tuesday, September 19, 16:30 - 18:00 |
| Presentation Time: | Tuesday, September 19, 16:30 - 18:00 |
| Presentation: |
Poster
|
| Topic: |
IFS: Information Forensics & Security: IFS-BIM Image & Video Biometric Analysis |
| Paper Title: |
CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY? |
| Authors: |
Xinwei Liu, University of Caen and Norwegian University of Science and Technology, France; Marius Pedersen, Norwegian University of Science and Technology, Norway; Christophe Charrier, University of Caen, France; Patrick Bours, Norwegian University of Science and Technology, Norway |