Technical Program

Paper Detail

Paper:TQ-PC.2
Session:Biometric Recognition II
Location:Poster Area C
Session Time:Tuesday, September 19, 16:30 - 18:00
Presentation Time:Tuesday, September 19, 16:30 - 18:00
Presentation: Poster
Topic: IFS: Information Forensics & Security: IFS-BIM Image & Video Biometric Analysis
Paper Title: CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?
Authors: Xinwei Liu, University of Caen and Norwegian University of Science and Technology, France; Marius Pedersen, Norwegian University of Science and Technology, Norway; Christophe Charrier, University of Caen, France; Patrick Bours, Norwegian University of Science and Technology, Norway