ICIP 2017 | 2017 IEEE International Conference on Image Processing | 17-20 September 2017 | Beijing, China
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MP-L4: Watermarking and Steganography

Session Type: Lecture
Time: Monday, September 18, 14:20 - 16:00
Location: Room 308
Session Chair: William Puech, Université de Montpellier
 
  MP-L4.1: CONTRIBUTION-BASED FEATURE TRANSFER FOR JPEG MISMATCHED STEGANALYSIS
         Chaoyu Feng; School of Information and Communication Engineering, Dalian University of Technology
         Xiangwei Kong; School of Information and Communication Engineering, Dalian University of Technology
         Ming Li; School of Information and Communication Engineering, Dalian University of Technology
         Yong Yang; School of Information and Communication Engineering, Dalian University of Technology
         Yanqing Guo; School of Information and Communication Engineering, Dalian University of Technology
 
  MP-L4.2: A NEW BLIND COLOR IMAGE WATERMARKING BASED ON A PSYCHOVISUAL MODEL AND QUANTIZATION APPROACHES
         Pascal Lefevre; University of Poitiers, XLIM
         Philippe Carré; University of Poitiers, XLIM
         Philippe Gaborit; University of Limoges, XLIM
 
  MP-L4.3: RETHINKING THE HIGH CAPACITY 3D STEGANOGRAPHY: INCREASING ITS RESISTANCE TO STEGANALYSIS
         Zhenyu Li; University of York
         Sébastien Beugnon; Université de Montpellier
         William Puech; Université de Montpellier
         Adrian Bors; University of York
 
  MP-L4.4: IMPROVING SPATIAL IMAGE ADAPTIVE STEGANALYSIS INCORPORATING THE EMBEDDING IMPACT ON THE FEATURE
         Chao Xia; Institute of Information Engineering, Chinese Academy of Sciences
         Qingxiao Guan; Institute of Information Engineering, Chinese Academy of Sciences
         Xianfeng Zhao; Institute of Information Engineering, Chinese Academy of Sciences
         Jing Dong; Institute of Automation, Chinese Academy of Sciences
         Zhoujun Xu; Beijing Information Technology Institute
 
  MP-L4.5: DCT/DWT BLIND MULTIPLICATIVE WATERMARKING THROUGH STUDENT-T DISTRIBUTION
         Antonis Mairgiotis; Technological Educational Institute of Thessaly
         Lisimachos P. Kondi; University of Ioannina
         Yongyi Yang; Illinois Institute of Technology