Technical Program

WP-PC: Image and Video Forensics II

Session Type: Poster
Time: Wednesday, September 20, 14:30 - 16:00
Location: Poster Area C
Session Chair: Siwei Lyu, University at Albany, State University of New York
 
WP-PC.1: SPOTTING THE DIFFERENCE: CONTEXT RETRIEVAL AND ANALYSIS FOR IMPROVED FORGERY DETECTION AND LOCALIZATION
         Joel Brogan; University of Notre Dame
         Paolo Bestagini; Politecnico di Milano
         Aparna Bharati; University of Notre Dame
         Allan Pinto; University of Notre Dame
         Daniel Moreira; University of Notre Dame
         Kevin Bowyer; University of Notre Dame
         Patrick Flynn; University of Notre Dame
         Anderson Rocha; University of Notre Dame
         Walter Scheirer; University of Notre Dame
 
WP-PC.2: COPY MOVE FORGERY DETECTION WITH SIMILAR BUT GENUINE OBJECTS
         Aniket Roy; Indian Institute of Technology Kharagpur
         Akhil Konda; Indian Institute of Technology Kharagpur
         Rajat Subhra Chakraborty; Indian Institute of Technology Kharagpur
 
WP-PC.3: FAST CAMERA FINGERPRINT MATCHING IN VERY LARGE DATABASES
         Samet Taspinar; PhD student at NYUAD
         Husrev Taha Sencar; TOBB University
         Sevinc Bayram; Hitachi Europe Ltd
         Nasir Memon; New York University
 
WP-PC.4: IDENTIFYING PHOTOREALISTIC COMPUTER GRAPHICS USING CONVOLUTIONAL NEURAL NETWORKS
         In-Jae Yu; Korea Advanced Institute of Science and Technology
         Do-Guk Kim; Korea Advanced Institute of Science and Technology
         Jin-Seok Park; Korea Advanced Institute of Science and Technology
         Jong-Uk Hou; Korea Advanced Institute of Science and Technology
         Sunghee Choi; Korea Advanced Institute of Science and Technology
         Heung-Kyu Lee; Korea Advanced Institute of Science and Technology
 
WP-PC.5: AUGMENTED CONVOLUTIONAL FEATURE MAPS FOR ROBUST CNN-BASED CAMERA MODEL IDENTIFICATION
         Belhassen Bayar; Drexel University
         Matthew C. Stamm; Drexel University
 
WP-PC.6: IMAGE FILTER IDENTIFICATION USING DEMOSAICING RESIDUAL FEATURES
         Chen Chen; Drexel University
         Matthew C. Stamm; Drexel University
 
WP-PC.7: SENSOR PATTERN NOISE ESTIMATION USING PROBABILISTICALLY ESTIMATED RAW VALUES
         Ambuj Mehrish; Indraprastha Institute of Information Technology Delhi
         A V Subramanyam Subramanyam; Indraprastha Institute of Information Technology Delhi
         Sabu Emmanuel; Kuwait university